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| Products / Metallurgical Image Analyser |
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| Metallurgical
Image Analyser |
| Mass
Spectrometers for Static and Dynamic SIMS |
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Introduction
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A good Metallurgical Image Analyser
must satisfy all the creative
urges of a Metallographer. And
in fact, must lend power and
character to his efforts by
generating information and reports,
which are as vivid as they are
objective.
The metallographer’s
interaction with his work must
extend well beyond the physical
confines of the System.
This can happen if the interaction
with the System providers is
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Easy, and
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in the language that he
understands best - metallurgy.
The eMPower Image Analyser assures
you all this and more-continued
software and hardcore upgradation,
most economically. And with
Service and Applications support.
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| Salient
Features: |
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• Objective, Accurate &
Reliable Analysis.
• On-line analysis (Previously
saved images can also be analysed).
• Calibration through reflecting
stage micrometer.
• Multiple frames per sample.
• 16detectable planes (phases)
with user-definable colours.
• Palette and Histograms
based threshold levels.
• Easy threshold /gray level
detection in any defined region.
• Cutomised & user definable
report templates.
• Flexible. Powerful. Easy
to use.
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| Software |
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• Very user-friendly, Windows
based system
• E-mails images
• Copying of reports / images
to other Windows based files
• Prompt Service / Application
Support
• Future software addition/upgrades
easily available
• Free upgrades for the
first 3 years after purchase
• Software development is
a continuing process at Metal
Power
• You give an idea and we
shall incorporate it for you-Free!
• On-line help
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| Hardware |
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• High resolution Metallurgical
Microscope.
• High resolution Colour
CCD compact/miniature Camera.
• High resolution imported
Image Acquisition/Frame Grabber
Card.
• Latest Pentium PC with
high resolution Deskjet Printer.
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| Analysis |
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AREA
FRACTION
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Threshold detection levels are based
on region selection.
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16 detectable planes with facility
to assign user-selectable colours.
• 16 phases can be detected,
if gray levels are distinctly different.
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GRAIN
SIZE MEASUREMENT - BY GRAIN AREA
METHOD • Gives
Mean ASTM grain size, along with
distribution.
• Details of individual
grains, when clicked.
• Tags/count grains.
OPTION AVAILABLE
• To include /exclude boundary
grains which are incomplete/cut.
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GRAIN
SIZE MEASUREMENT - BY INTERCEPT
MEASUREMENT METHOD
Results indicated thus-
• ASTM grain size no.
• In each intercept mode,
• Overall mean grain
size no.
• The standard
deviations. |
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INCLUSION
RATING
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As per ASTM E 45/1122Rates and identifies
various inclusions.
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Classifies into thin, thick &oversize
as per ASTM.
• Sixty frames
‘(views) per sample available
for complete sample scan.
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Option: Inclusive rating as per
DIN 50602&JIS G 0555 |
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NODULARITY
MEASUREMENTS
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Nodule count with identification
of non-nodules.
• % nodules
at specified spheroidicity. Nodules
count per unit area.
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-User definable options: •
Minimum nodule size.
• Percent
tolerance.
• Non-nodular
colour identification. |
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FEATURE
MEASUREMENTS
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Measures feature properties of interest.
• Gives area-wise, length-wise
& orientation-wise distribution.
• Gives details of each feature
when clicked.
• Tags/Counts
feature. |
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LINEAR
& OTHER MEASUREMENTS
Can measure and indicate following
parameters directly on image:
• Straight & curved
lines.
• Any regular
or irregular closed shape /area.
• Included angles.
• Counting of features.
• Different parameters
can be selected using different
colours. Hence, multiple parameters
can be analysed even with gray level
overlaps. |
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REPORTING
Retention & storage of all analysed
parameters in specified or user
definable (flexible) template formats,
viz.
• Adding
title, editing text descriptions
• Placing of original
& threshold images.
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Results in tabular form & as
bar graphs.
• Allows
saving of report templates for future
report generation.
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Ability to store & retrieve
data, including frames taken for
each sample. |
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| Techincal
Specifications |
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HARDWARE
MICROSCOPE:
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High-resolution, Erect, Microscope
• Mag
50x to 1500/2000X. White frost
& Infra-red filters
• C-mount
adapter & Stage Micrometer.
Polarizer Set
CCD
COLOUR CAMERA:
• High
resolution CCD colour camera
• Resolution
minimum752x582 pixels /470 TV
lines
• Compact/
Miniature Camera
• Automatic
Gain Control
• Auto
White balance
• Auto/Manual
Shutter
IMAGE GRABBING
& PROCESSING HARDWARE:
• High-resolution
Image Acquisition Card
• Resolution
min 768x582 pixels/470 TV lines
• 8
bit gray scale, 24 bit true
colour
• Multi-standard
Frame Grabbing (CCIR, PAL/S-Video/Y/C)
• 4
selectable inputs (4 microscope
with CCD cameras can be connected
to the same card /image analyser)
• Supports
OS-WIN 98/2000, XP
COMPUTER:
• Latest
Pentium Computer with SVGA 17”
Colour Monitor. (Other monitor
sizes can be given as optional
extra)
PRINTER:
• Latest
high-resolution Colour Deskjet
Printer
SOFTWARE
IMAGE PROCESSING,
EDITING & ORIENTATION
• IMAGE
FILTERS: sharpen, blur, outline,
trace, flip, mirror, zoom, rotate,
remove noise, convolution, and
draw.
• BRIGHTNESS/CONTRAST:
increase/decrease brightness,
gammabrighten, histobrighten,
equalize, expand contrast,
negative,
kodalith.
• BIT
PLANES: 16-Bit planes, all detectable
independently and processed
separately.
• POST
THRESHOLD: open/close boundaries,
dilate, erode.
• HISTOGRAM:
Grey level Histogram: of image
as well as a line drawn across
the image.
IMAGE ANALYSIS
• OBJECT
DEFINATION & OPERATION:
Area and linear Measurements
– length, depth, shape
factor, aspect ratio
• STATICAL
OPERATIONS: Variance, Mean &
Median, Standard Deviation parameters
for selected objects
• OBJECT
MANAGEMENT: Grouping search
– individual, group-wise
• CHORD
SIZING: Retain only those above
certain specified value
• CALIBRATION:
1)
For standard objective magnifications
– 15
2)
For user definable objective
magnification – 10
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